Method for identifying a semiconductor die using an IC with programmable links
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United States of America Patent
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Apr 5, 1994
Grant Date -
N/A
app pub date -
Dec 31, 1992
filing date -
Dec 31, 1992
priority date (Note) -
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status (Latency Note)
Importance
Abstract
A method for identifying a semiconductor die includes a programmable integrated circuit formed on the semiconductor die. The programmable circuit includes FET transistors connected to output nodes and to programmable links such as fuses, anti-fuses or laser programmable links which are connected to ground. A gate element of each transistor is connected to an address line which controls current flow through the transistors to the output nodes. During manufacture, the programmable links can be selectively activated to create an identification code which can be read at the output nodes of the integrated circuit upon input of a predetermined address code.
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