Anisotropically etched ink fill slots in silicon

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United States of America Patent

PATENT NO 5308442
SERIAL NO

08009181

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Abstract

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An ink fill slot 18 can be precisely manufactured in a substrate 12 utilizing photolithographic techniques with chemical etching. N-type <100> silicon wafers are double-side coated with a dielectric layer 26 comprising a silicon dioxide layer and/or a silicon nitride layer. A photoresist step, mask alignment, and plasma etch treatment precede an anisotropic etch process, which employs an anisotropic etchant for silicon such as KOH or ethylene diamine para-catechol. The anisotropic etch is done from the backside 12b of the wafer to the frontside 12a, and terminates on the dielectric layer on the frontside. The dielectric layer on the frontside creates a flat surface for further photoresist processing of thin film resistors 16.

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Patent Owner(s)

Patent OwnerAddress
HEWLETT-PACKARD DEVELOPMENT COMPANY L P10300 ENERGY DRIVE SPRING TX 77389

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Gallicano, Joan P Fremont, CA 1 131
Taub, Howard H San Jose, CA 14 842

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