US Patent No: 5,309,108

Number of patents in Portfolio can not be more than 2000

Method of inspecting thin film transistor liquid crystal substrate and apparatus therefor

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Abstract

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The invention relates to a method of inspecting and correcting a thin film transistor liquid crystal substrate and an apparatus therefor, where a plurality of scan lines and signal lines are connected electrically in common at each one terminal side respectively, and an infrared image outside the pixel domain is detected after lapse of a prescribed time from the time point of applying voltage between the scan lines and the signal lines, and an infrared image outside the pixel domain is detected after lapse of a prescribed time from the time point of stopping the voltage application, and the scan lines and the signal lines relating to variation of the heating state are detected from difference or quotient between an infrared image at the voltage applying state and an infrared image at the stopping state of voltage application, thereby a pixel address with a shortcircuit defect occurring is specified. If an image part being equal to the set threshold value or more does not exist in the difference infrared image in the pixel address, a wiring pattern position in the pixel address is detected from a visible image of the pixel address, and this wiring pattern and one from a neighboring pixel address are compared to detect a short circuit defect which can be removed by laser.

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Patent Owner(s)

Patent OwnerAddressTotal Patents
HITACHI, LTD.TOKYO31537

International Classification(s)

Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Kubota, Hitoshi Fujisawa, JP 127 1324
Maeda, Shunji Tokyo, JP 306 1902
Ono, Makoto Tokyo, JP 163 1025

Cited Art Landscape

Patent Info (Count) # Cites Year
 
PHOTON DYNAMICS, INC. (2)
5,073,754 Method and apparatus for testing LCD panel array using a magnetic field sensor 17 1990
5,175,504 Method and apparatus for automatically inspecting and repairing a simple matrix circuit panel 22 1991
 
GENRAD, INC. (1)
5,057,775 Method of testing control matrices for flat-panel displays 19 1990
 
Hitachi Video Engineering, Inc. (1)
5,146,509 Method of inspecting defects in circuit pattern and system for carrying out the method 31 1990
 
HITACHI, LTD. (1)
4,628,531 Pattern checking apparatus 77 1984
 
MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD. (1)
4,940,934 Method of electrically testing active matrix substrate 16 1988
 
TPO HONG KONG HOLDING LIMITED (1)
4,843,312 Test method for LCD elements 35 1988

Patent Citation Ranking

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Patent Info (Count) # Cites Year
 
HISTORX, INC. (5)
8,335,360 Compartment segregation by pixel characterization using image data clustering 3 2008
8,120,768 Method and system for standardizing microscope instruments 0 2011
8,027,030 Method and system for standardizing microscope instruments 0 2011
8,314,931 Method and system for standardizing microscope instruments 0 2011
8,655,037 Compartment segregation by pixel characterization using image data clustering 0 2012
 
CANON KABUSHIKI KAISHA (4)
6,118,279 Magnetic detection of short circuit defects in plate structure 5 1997
6,107,806 Device for magnetically sensing current in plate structure 3 1997
6,323,653 Magnetic detection of short circuit defects in plate structure 3 2000
6,307,382 Device and method for magnetically sensing current in plate structure 1 2000
 
SHARP KABUSHIKI KAISHA (3)
5,740,272 Inspection apparatus of wiring board 15 1996
7,783,103 Defect detecting device, image sensor device, image sensor module, image processing device, digital image quality tester, and defect detecting method 3 2006
8,439,717 Device and method for manufacturing active matrix substrate, and device and method for manufacturing display panel 0 2010
 
APPLIED MATERIALS, INC. (2)
6,175,645 Optical inspection method and apparatus 90 1998
7,317,325 Line short localization in LCD pixel arrays 2 2005
 
AU OPTRONICS CORP. (2)
6,697,037 TFT LCD active data line repair 15 1996
7,399,965 Method of detecting array of liquid crystal display and apparatus thereof 2 2005
 
INTERNATIONAL BUSINESS MACHINES CORPORATION (2)
6,560,556 Non-invasive process for circuit defect isolation using thermal expansion property of thermodynamics 1 1999
7,091,738 Inspection system for active matrix panel, inspection method for active matrix panel and manufacturing method for active matrix OLED panel 5 2004
 
LUCENT TECHNOLOGIES INC. (2)
5,614,839 Method for optically testing flat panel display base plates 8 1996
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Marena Systems Corporation (2)
6,840,666 Methods and systems employing infrared thermography for defect detection and analysis 18 2003
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SAMSUNG DISPLAY CO., LTD. (2)
8,115,505 Differential signaling system and flat panel display with the same 1 2008
7,919,975 Differential signaling system and flat panel display with the same 0 2008
 
ADVANTEST CORPORATION (1)
5,793,221 LCD panel test apparatus having means for correcting data difference among test apparatuses 33 1996
 
BOE-HYDIS TECHNOLOGY CO., LTD. (1)
6,246,253 System for testing liquid crystal and end seal of LCD cell 9 1999
 
CENTRAL GLASS COMPANY, LIMITED (1)
7,332,718 Method for finding disconnection of conductive wires formed on plate glass and apparatus therefor 2 2003
 
HITACHI HIGH-TECHNOLOGIES CORPORATION (1)
7,129,727 Defect inspecting apparatus 3 2005
 
KABUSHIKI KAISHA TOSHIBA (1)
6,084,716 Optical substrate inspection apparatus 39 1998
 
MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD. (1)
6,714,671 Method of detecting pattern defects 1 2000
 
NEC CORPORATION (1)
5,640,099 Method and apparatus for detecting short circuit point between wiring patterns 8 1995
 
NIKON CORPORATION (1)
6,775,419 Image processing method, image processing apparatus, and storage medium for storing control process 7 2000
 
NOKIA CORPORATION (1)
6,983,067 Testing an image display device 8 2001
 
SEIKO EPSON CORPORATION (1)
7,091,965 Display device, method of driving the same, and electronic equipment 0 2003
 
SHENZHEN CHINA STAR OPTOELECTRONICS TECHNOLOGY CO., LTD. (1)
8,854,616 Visual inspection apparatus for glass substrate of liquid crystal display and inspection method thereof 0 2011
 
SONY CORPORATION (1)
8,334,822 Display apparatus, driving method for display apparatus and electronic apparatus 0 2009
 
THERMOTEKNIX SYSTEMS LIMITED (1)
5,483,604 Monitoring changes in image characteristics 7 1994
 
Other [Check patent profile for assignment information] (1)
6,545,500 Use of localized temperature change in determining the location and character of defects in flat-panel displays 16 1999