Method of inspecting thin film transistor liquid crystal substrate and apparatus therefor

Number of patents in Portfolio can not be more than 2000

United States of America Patent

PATENT NO 5309108
SERIAL NO

07921583

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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The invention relates to a method of inspecting and correcting a thin film transistor liquid crystal substrate and an apparatus therefor, where a plurality of scan lines and signal lines are connected electrically in common at each one terminal side respectively, and an infrared image outside the pixel domain is detected after lapse of a prescribed time from the time point of applying voltage between the scan lines and the signal lines, and an infrared image outside the pixel domain is detected after lapse of a prescribed time from the time point of stopping the voltage application, and the scan lines and the signal lines relating to variation of the heating state are detected from difference or quotient between an infrared image at the voltage applying state and an infrared image at the stopping state of voltage application, thereby a pixel address with a shortcircuit defect occurring is specified. If an image part being equal to the set threshold value or more does not exist in the difference infrared image in the pixel address, a wiring pattern position in the pixel address is detected from a visible image of the pixel address, and this wiring pattern and one from a neighboring pixel address are compared to detect a short circuit defect which can be removed by laser.

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First Claim

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Patent Owner(s)

Patent OwnerAddressTotal Patents
HITACHI, LTD.TOKYO13740

International Classification(s)

Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Kubota, Hitoshi Fujisawa, JP 113 1706
Maeda, Shunji Yokohama, JP 198 2686
Ono, Makoto Yokohama, JP 132 1391

Cited Art Landscape

Patent Info (Count) # Cites Year
 
GENRAD, INC. (1)
* 5057775 Method of testing control matrices for flat-panel displays 20 1990
 
TPO HONG KONG HOLDING LIMITED (1)
* 4843312 Test method for LCD elements 35 1988
 
Hitachi Video Engineering, Inc. (1)
* 5146509 Method of inspecting defects in circuit pattern and system for carrying out the method 32 1990
 
PHOTON DYNAMICS, INC. (2)
* 5073754 Method and apparatus for testing LCD panel array using a magnetic field sensor 19 1990
* 5175504 Method and apparatus for automatically inspecting and repairing a simple matrix circuit panel 25 1991
 
HITACHI, LTD. (1)
* 4628531 Pattern checking apparatus 77 1984
 
MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD. (1)
* 4940934 Method of electrically testing active matrix substrate 16 1988
* Cited By Examiner

Patent Citation Ranking

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Patent Info (Count) # Cites Year
 
Other [Check patent profile for assignment information] (1)
* 6545500 Use of localized temperature change in determining the location and character of defects in flat-panel displays 20 1999
 
SHENZHEN CHINA STAR OPTOELECTRONICS TECHNOLOGY CO., LTD. (2)
* 2012/0310,552 Detection Method and System for Array Substrate 0 2011
* 8854616 Visual inspection apparatus for glass substrate of liquid crystal display and inspection method thereof 0 2011
 
SEIKO EPSON CORPORATION (1)
* 7091965 Display device, method of driving the same, and electronic equipment 0 2003
 
JOLED INC. (1)
* 8334822 Display apparatus, driving method for display apparatus and electronic apparatus 0 2009
 
Thermoteknix Systems Ltd. (1)
* 5483604 Monitoring changes in image characteristics 7 1994
 
NOVARTIS AG (11)
8335360 Compartment segregation by pixel characterization using image data clustering 4 2008
* 2009/0034,823 Compartment segregation by pixel characterization using image data clustering 12 2008
9240043 Reproducible quantification of biomarker expression 0 2009
* 2010/0136,549 REPRODUCIBLE QUANTIFICATION OF BIOMARKER EXPRESSION 11 2009
8120768 Method and system for standardizing microscope instruments 0 2011
* 8027030 Method and system for standardizing microscope instruments 0 2011
* 2011/0116,087 METHOD AND SYSTEM FOR STANDARDIZING MICROSCOPE INSTRUMENTS 4 2011
* 8314931 Method and system for standardizing microscope instruments 1 2011
* 2011/0299,070 METHOD AND SYSTEM FOR STANDARDIZING MICROSCOPE INSTRUMENTS 6 2011
8655037 Compartment segregation by pixel characterization using image data clustering 0 2012
9080978 Method and system for standardizing microscope instruments 0 2013
 
Boe Hydis Technology Co., Ltd. (1)
* 6246253 System for testing liquid crystal and end seal of LCD cell 9 1999
 
SAMSUNG ELECTRONICS CO., LTD. (1)
* 2015/0153,593 SUBSTRATE INSPECTION APPARATUS INCLUDING LIQUID CRYSTAL MODULATOR AND MANUFACTURING METHOD OF THE LIQUID CRYSTAL MODULATOR 0 2014
 
PANASONIC LIQUID CRYSTAL DISPLAY CO., LTD. (2)
* 8957962 Defect correcting method and defect correcting device for an electronic circuit pattern 0 2010
* 2010/0302,360 DEFECT CORRECTING METHOD AND DEFECT CORRECTING DEVICE FOR AN ELECTRONIC CIRCUIT PATTERN 3 2010
 
NOKIA TECHNOLOGIES OY (2)
* 6983067 Testing an image display device 10 2001
* 2002/0157,033 Testing an image display device 2 2001
 
AU OPTRONICS CORP. (3)
6697037 TFT LCD active data line repair 17 1996
* 7399965 Method of detecting array of liquid crystal display and apparatus thereof 2 2005
* 2006/0163,476 Method of detecting array of liquid crystal display and apparatus thereof 1 2005
 
KLA-TENCOR CORPORATION (1)
* 2008/0246,030 TEST STRUCTURES AND METHODS FOR INSPECTION OF SEMICONDUCTOR INTEGRATED CIRCUITS 20 2007
 
Marena Systems Corporation (3)
6840666 Methods and systems employing infrared thermography for defect detection and analysis 22 2003
* 7149343 Methods for analyzing defect artifacts to precisely locate corresponding defects 9 2003
* 2003/0222,220 Methods for analyzing defect artifacts to precisely locate corresponding defects 1 2003
 
NEC CORPORATION (1)
* 5640099 Method and apparatus for detecting short circuit point between wiring patterns 8 1995
 
KABUSHIKI KAISHA TOSHIBA (1)
* 6084716 Optical substrate inspection apparatus 45 1998
 
NATIONAL TSING HUA UNIVERSITY (2)
* 9380223 Device for contactlessly testing passive routing substrates 0 2013
* 2015/0103,161 Device for Contactlessly Testing Passive Routing Substrates 1 2013
 
ADVANTEST CORPORATION (1)
* 5793221 LCD panel test apparatus having means for correcting data difference among test apparatuses 35 1996
 
CANON KABUSHIKI KAISHA (4)
* 6118279 Magnetic detection of short circuit defects in plate structure 8 1997
* 6107806 Device for magnetically sensing current in plate structure 4 1997
6323653 Magnetic detection of short circuit defects in plate structure 4 2000
6307382 Device and method for magnetically sensing current in plate structure 1 2000
 
SHARP KABUSHIKI KAISHA (4)
* 5740272 Inspection apparatus of wiring board 16 1996
* 7783103 Defect detecting device, image sensor device, image sensor module, image processing device, digital image quality tester, and defect detecting method 3 2006
* 2007/0071,304 Defect detecting device, image sensor device, image sensor module, image processing device, digital image quality tester, and defect detecting method 9 2006
8439717 Device and method for manufacturing active matrix substrate, and device and method for manufacturing display panel 0 2010
 
INTERNATIONAL BUSINESS MACHINES CORPORATION (3)
6560556 Non-invasive process for circuit defect isolation using thermal expansion property of thermodynamics 2 1999
* 7091738 Inspection system for active matrix panel, inspection method for active matrix panel and manufacturing method for active matrix OLED panel 6 2004
* 2005/0088,198 Inspection system for active matrix panel, inspection method for active matrix panel and manufacturing method for active matrix OLED panel 0 2004
 
NIKON CORPORATION (1)
* 6775419 Image processing method, image processing apparatus, and storage medium for storing control process 7 2000
 
HEWLETT-PACKARD DEVELOPMENT COMPANY, L.P. (1)
* 9607367 Adaptive pattern generation 0 2012
 
LUCENT TECHNOLOGIES INC. (2)
* 5614839 Method for optically testing flat panel display base plates 8 1996
* 6111424 Testing method and apparatus for flat panel displays using infrared imaging 30 1997
 
SAMSUNG DISPLAY CO., LTD. (3)
8115505 Differential signaling system and flat panel display with the same 1 2008
* 7919975 Differential signaling system and flat panel display with the same 1 2008
* 2008/0238,443 DIFFERENTIAL SIGNALING SYSTEM AND FLAT PANEL DISPLAY WITH THE SAME 2 2008
 
Central Glass Company, Limited (2)
7332718 Method for finding disconnection of conductive wires formed on plate glass and apparatus therefor 2 2003
* 2004/0124,358 Method for finding disconnection of conductive wires formed on plate glass and apparatus therefor 2 2003
 
HITACHI HIGH-TECHNOLOGIES CORPORATION (2)
* 7129727 Defect inspecting apparatus 3 2005
* 2006/0087,330 Defect inspecting apparatus 2 2005
 
Shenzhen China Star Optoelrctronics Technology Co., LTD. (1)
* 2013/0033,706 Visual Inspection Apparatus For Glass Substrate Of Liquid Crystal Display And Inspection Method Thereof 0 2011
 
APPLIED MATERIALS, INC. (3)
* 6175645 Optical inspection method and apparatus 101 1998
* 7317325 Line short localization in LCD pixel arrays 2 2005
* 2006/0125,510 Line short localization in LCD pixel arrays 4 2005
 
MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD. (1)
* 6714671 Method of detecting pattern defects 3 2000
* Cited By Examiner