Reduced pressure processing system and reduced pressure processing method

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United States of America Patent

PATENT NO 5314541
SERIAL NO

07889378

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Abstract

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A reduced pressure processing system includes a load lock chamber having an opening communicating with a process atmosphere in which a wafer is processed and/or the outer air atmosphere, a gate valve which is arranged at the opening to close/open the chamber with respect to the process atmosphere and/or the outer air atmosphere, a robot for loading/unloading the wafer into/from the chamber, an evacuation pump for evacuating the chamber, a heater for heating the wall of the chamber, and a controller for controlling the gate valve, the robot, the evacuation pump, and the heater.

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Patent Owner(s)

Patent OwnerAddress
TOKYO ELECTRON LIMITEDTOKYO JAPAN

International Classification(s)

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Ikeda, Towl Kofu, JP 14 447
Ishii, Nobuo Yamanashi, JP 83 3487
Iwata, Teruo Nirasaki, JP 29 1917
Saeki, Hiroaki Yamanashi, JP 72 4167
Saito, Masasi Yamanashi, JP 2 103

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