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Abstract

A process for analyzing a spectral signal generated by a birefringent element and transmitted to an array. An output spectral signal emanating from the array is converted from an analog to a digital signal to establish a reference wave form which has a dominant frequency after the birefringent element is exposed to a known temperature. Thereafter, a current wave form is generated from the output spectral signal emanating from the array. A phase and frequency relationship is obtained by cross correlating the current wave form and the reference wave form. The dominant frequency for the phase and frequency relationship is obtained by Fast Fourier Transformation. Thereafter, the dominant frequency for the phase and frequency relationship of the current wave form is compared with the dominant frequency for the reference wave form to determine a temperature range. The temperature range and phase and dominant frequency for the current wave form are matched with a reference schedule stored in the memory of a digital signal processor to predict the current temperature experienced by the birefringent element. This predicted temperature is displayed on a screen to inform an operator of the current operational conditions experienced by the birefringent element.

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First Claim