Automatic range selection-type analog tester

Number of patents in Portfolio can not be more than 2000

United States of America Patent

PATENT NO 5319305
SERIAL NO

08050731

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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An automatic range selection-type analog tester capable of automatically switching to the optimum measuring range even if the measurand of an object to be measured is undetermined. A range select signal generating circuit is designed to generate a range select signal for selecting one of a plurality of voltage dividers of a range selector circuit in such a manner that the divided voltage output of the object divided through the range selector circuit comes into a predetermined range and also a range display displays the corresponding measuring range in accordance with the range select signal.

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Patent Owner(s)

Patent OwnerAddressTotal Patents
Kabushiki Kaisha Sanwa Keiki SeisakushoTOKYO0

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Baba, Nobuharu Tokyo, JP 1 12

Cited Art Landscape

Patent Info (Count) # Cites Year
 
FLUKE CORPORATION (2)
* 5119019 Automatic function selecting multimeter 22 1989
* 5218290 Multi-function, multi-mode switch for an instrument 21 1991
* Cited By Examiner

Patent Citation Ranking

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Patent Info (Count) # Cites Year
 
QUALCOMM INCORPORATED (2)
9081396 Low power and dynamic voltage divider and monitoring circuit 0 2013
9797959 Battery fuel gauges using FET segment control to increase low current measurement accuracy 0 2013
 
Southern California Edison Company (1)
* 5652526 Electric motor analyzer 5 1996
 
Albert Maurer (1)
* 5608319 Method and apparatus for measuring magnetic fields with magnetic field polarity display and zero point adjustment 3 1994
 
HON HAI PRECISION INDUSTRY CO., LTD. (1)
* 2008/0116,879 VOLTAGE MEASURING DEVICE 2 2007
 
THE BOEING COMPANY (3)
* 7908082 Methods and systems for displaying airport moving map information 5 2007
* 2008/0275,642 METHODS AND SYSTEMS FOR DISPLAYING AIRPORT MOVING MAP INFORMATION 21 2007
8306745 Methods and systems for displaying airport moving map information 6 2011
 
APPLE INC. (1)
* 5617035 Method for testing integrated devices 110 1995
 
DELPHI TECHNOLOGIES, INC. (1)
* 5450008 Adaptive loading circuit for a differential input magnetic wheel speed sensor 7 1994
 
FREESCALE SEMICONDUCTOR, INC. (1)
* 5467024 Integrated circuit test with programmable source for both AC and DC modes of operation 86 1993
 
SNAP-ON TOOLS CORPORATION (1)
6242921 Alternator testing apparatus and method 5 1998
 
DELL PRODUCTS L.P. (1)
6600747 Video monitor multiplexing circuit 16 1998
 
TEKTRONIX, INC. (1)
* 6380726 Smart auto-ranging RMS measurement method and apparatus 8 1998
* Cited By Examiner