Method of effecting NIR-analyses of successive material samples, and a system for carrying out the method

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United States of America Patent

PATENT NO 5324949
SERIAL NO

07576505

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Abstract

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With the present invention, the NIR-technique is utilized for a fully automatic on-line analyzing of successive samples, viz. with the use of a test chamber which is built together with the optical unit and is open towards this unit through a restricted side opening. The test chamber has a volume which is much larger than that of the known test cups, whereby the remnant-pollution of the following sample can be kept at an acceptable low level, without the test chamber having to be totally cleaned each time. A particularly critical area, however, is the material area just next to the optical unit, and remnants at this place must by necessity be removed. The present invention provides for a complete avoidance of such remnant deposits, in that between the side opening of the test chamber and the optical unit, there is placed a transparent, thin separation film, which between successive operations is advanced for removal of the last used film area and for delivery of a new and entirely clean film area to the critical area.

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Patent Owner(s)

Patent OwnerAddress
SPROUT-MATADOR A/SGLENTEVEJ 5-7 DK-6705 ESBJERG

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Johnsen, Erik Vejle, DK 8 24

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