Method and apparatus for pattern mapping system with self-reliability check
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United States of America Patent
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Aug 2, 1994
Issued Date -
N/A
app pub date -
Dec 9, 1993
filing date -
Sep 20, 1991
priority date (Note) -
Expired
status (Latency Note)
Importance
Abstract
A pattern mapping system provides indication of reliability of pattern or category selection indicated by output nodes. The indication of reliability includes a quantitative indication of error in the output and an indication when training is insufficient for the system to respond to the input pattern accurately. The error indication is based on error in the outputs produced by the system as trained in response to given inputs, and accuracy of fit of training data to the output. The insufficiency of the mapping system as trained is determined according to training data density local to the subject input pattern.
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