Multilayer magnetic structure wherein the magnitude of the structure magnetoresistance is a function of nonmagnetic layer thickness

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United States of America Patent

PATENT NO 5341118
SERIAL NO

08060462

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Abstract

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A multilayer magnetoresistive (MR) sensor formed on a substrate includes alternating layers of a ferromagnetic material and a non-magnetic metallic material. The ferromagnetic material and the non-magnetic material form bilayers which exhibit the property that the magnetoresistance of the multilayered structure oscillates as a function of thickness of the non-magnetic material. A current flow is produced through the MR sensor, and the variations in the resistivity of the MR sensor are sensed as a function of the magnetic field being sensed.

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Patent Owner(s)

Patent OwnerAddress
HITACHI GLOBAL STORAGE TECHNOLOGIES NETHERLANDS B VAMSTERDAM AMSTERDAM NORTH HOLLAND

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Parkin, Stuart S P San Jose, CA 42 2163
Roche, Kevin P San Jose, CA 4 121

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