Solid state detector for polarized x-rays

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United States of America Patent

PATENT NO 5349192
SERIAL NO

08065127

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Abstract

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A solid state x-ray detector has a set of bilayers formed on its front surface. Each bilayer includes a spacing layer and an absorbing layer which have different indexes of refraction, and the impinging x-rays strike the bilayers at an angle which satisfies the Bragg condition. As a result, x-rays polarized in one direction are substantially reflected while x-rays polarized in an orthogonal direction pass through the bilayers for detection by the solid state x-ray detector.

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Patent Owner(s)

Patent OwnerAddress
WISCONSIN ALUMNI RESEARCH FOUNDATION614 WALNUT STREET MADISON WI 53726

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Mackay, James F Madison, WI 5 160

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