Opto-electronic measuring device with optical air wedge spectral analysis arrangement
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United States of America Patent
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Sep 20, 1994
Issued Date -
N/A
app pub date -
Mar 31, 1992
filing date -
Jan 18, 1989
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Abstract
A measuring device comprises a light source with a wide spectrum feeding an optical sensor through an optical fiber. The sensor comprises an interferometer adjusted to a dull tint and an optical component sensitive to a measured parameter, which may be either a pressure, a measured displacement or an index of refraction of a fluid, a readout device includes the photodetector, a processing unit and an optical wedge for producing fringes, whose lateral positions, in contrast, are representative of the spectrum of the flux leaving the interferometer and analyzed by the photodetector. The processing unit measures the lateral position of the fringe and converts it into a value of the parameter P.
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