Dry etching method

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United States of America Patent

PATENT NO 5354416
SERIAL NO

07503124

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Abstract

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Etching of an article is carried out by maintaining the article at a temperature at which the vapor pressure of etching gas molecules becomes equal to or higher than the pressure of etching gas and the vapor pressure of neutral radicals contained in a plasma becomes equal to or lower than the pressure of an etching gas. An etching pattern with a substantially vertical side profile and extremely small in dimensional shift from the mask can be formed at high precision.

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Okudaira, Sadayuki 164-15, Chigasemachi-2-chome, Ome-shi, JP 32 2333
Tachi, Shinichi Sayama Niyu Taun 47-11, 2520-62, Kashiwabara, Sayama-shi, JP 52 2566
Tsujimoto, Kazunori 44-17, Sakuragaoka-3-chome, Higashiyamato-shi, JP 34 2031

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