Fabrication method of thin-film transistor

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United States of America Patent

PATENT NO 5366912
SERIAL NO

07409803

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Abstract

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A thin-film transistor comprises a first amorphous semiconductor layer acting as a channel, a second n.sup.+ amorphous semiconductor layer formed on the first amorphous semiconductor layer, a diffusion preventive layer of chromium provided between the second amorphous semiconductor layer and source/drain metal electrodes. The diffusion preventive layer is formed by removing a portion of a diffusion preventive layer forming film not being covered by a patterned resist film using a first etchant. Then, the second amorphous semiconductor layer is formed by removing a portion of a second amorphous semiconductor layer forming film not being covered by the patterned resist film or the diffusion preventive layer using a second etchant which dissolves the second amorphous semiconductor layer forming film but does not dissolve the diffusion preventive layer.

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Patent Owner(s)

  • FUJI XEROX CO., LTD.

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Kobayashi, Kenichi Kanagawa, JP 331 4338

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