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United States of America Patent
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-
Nov 22, 1994
Grant Date -
N/A
app pub date -
Jun 1, 1993
filing date -
Jun 1, 1993
priority date (Note) -
In Force
status (Latency Note)
Importance
Abstract
A method of evaluating defects in a surface as compared with a reference surface by providing a surface for defect evaluation, illuminating and projecting a pattern of lines on the surface having a periodic configuration with features having a separation period, providing a camera for recording a reflected image of the pattern of lines projected and reflected from the surface, and evaluating and quantifying the image by calculating a slope of a defect observed by the camera using a specified relationship. The distance between the illuminated pattern and the surface are used to calculate the defect slope and a defect depth value is generated using a specified relationship dependent on length of a defect area visually recognizable from the reflected image and the calculated defect slope.
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