Method and apparatus for measuring photoluminescence in crystal

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United States of America Patent

PATENT NO 5381016
SERIAL NO

08037994

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Abstract

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Provided are a method and an apparatus for measuring photoluminescence, which can measure the inside of crystal such as silicon. A lifetime of fluorescence-generating carrier may be evaluated in a mathematical technique without using an expensive pulse laser source. Also, an incident beam wavelength dependency and a polarization dependency of fluorescence may be evaluated by a simple method. A laser having a wavelength which can go into a crystal is projected into an object crystal, fluorescence in generated light inside the crystal is separated through a filter having a frequency band for transmission of fluorescence. An intensity and a spread of fluorescence are obtained as a function of depth from a surface of the crystal to evaluate the lifetime of luminescent center in a mathematical manner. The projection light wavelength dependency of fluorescence may be evaluated by rotating a narrow-band filter, and a polarization dependency by suitably inserting a polarizing filter into an optical patch.

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Patent Owner(s)

Patent OwnerAddress
RAYTEX CORPORATION1-33-3 OCHIAI TAMA-SHI TOKYO

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Moriya, Kazuo Ageo, JP 29 233

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