Circuit testing system
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United States of America Patent
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-
Jan 10, 1995
Grant Date -
N/A
app pub date -
Jan 25, 1993
filing date -
Feb 25, 1992
priority date (Note) -
Expired
status (Latency Note)
Importance
Abstract
The present invention relates to the field of circuit assembly testing systems and provides improved systems and methods for debugging circuit test systems and diagnosing faults in circuit assemblies. An expert system derives possible root causes of test failures, predicts test results based on these possible root causes and uses factual observations to refute inconsistent hypothetical root causes. Tests useful in refuting inconsistent hypothetical root causes are devised and run automatically by the system.
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Cited Art Landscape
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