High density probe card for testing electrical circuits
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United States of America Patent
Stats
-
Jan 17, 1995
Grant Date -
N/A
app pub date -
Sep 21, 1992
filing date -
Sep 21, 1992
priority date (Note) -
In Force
status (Latency Note)
Importance
Abstract
A probe card formed of a printed circuit board having an opening therein and having a ground plane formed on the lower surface thereof. A ground strip formed of aluminum is secured to the printed circuit board and positioned adjacent the opening and in electrical contact with the ground plane. The strip includes a support surface for supporting a plurality of probes extending along and parallel to the surface and secured thereto by insulating means to maintain a predetermined distance from the support surface. The probes extend into the opening for making temporary electrical contact with a circuit to be tested.
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