Self re-seeding linear feedback shift register (LFSR) data processing system for generating a pseudo-random test bit stream and method of operation

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United States of America Patent

PATENT NO 5383143
SERIAL NO

08220348

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Abstract

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A data processing system (10) has a test controller (12). The test controller (12) has a pattern generator (18) for receiving a seed value and generating many pseudo-random values from the seed value. A re-seed and compare circuit (22) monitors the pattern generator (12) and determined when the seed value repeats in the pseudo-random number sequence generated by the generator (18). Once circuit (22) determines that the seed value has repeated the control circuit (20) allows the generator (18) to clock once more and latches a new seed value into the circuit (22). Therefore, the pattern generator through the compare/store function of circuit (22) and the control of circuit (20) is self re-seeding and generates a longer string of pseudo-random numbers with minimal logic.

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Patent Owner(s)

Patent OwnerAddress
FREESCALE SEMICONDUCTOR INC6501 WILLIAM CANNON DRIVE WEST AUSTIN TX 78735

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Crouch, Alfred L Austin, TX 23 874
Pressly, Matthew D Austin, TX 6 592

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