Detection system for atomic force microscopes
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United States of America Patent
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Feb 14, 1995
Grant Date -
N/A
app pub date -
Oct 15, 1993
filing date -
Oct 15, 1993
priority date (Note) -
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Abstract
A scanning probe microscope is provided with a piezo-ceramic tube to carry the sensitive probe at its free end to translationally move the probe in the X and Y directions. Large stationary surfaces can then be scanned by probe tip motion. The tube is also capable of movement in the Z direction so that the tip can follow the contours of the surface. Optical detection means track the motion of the probe tip and generate signals corresponding to and representative of surface contours. In one mode of operation, the signals are used in a feed back loop to keep constant the spacing between the tip and the surface, in which case the error or control signals represent the contours.
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