Method and apparatus for near-field, scanning, optical microscopy by reflective, optical feedback
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United States of America Patent
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Feb 14, 1995
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N/A
app pub date -
Jul 29, 1993
filing date -
Jul 29, 1993
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Abstract
Apparatus and methods of near-field scanning optical microscopy (NSOM) are described. A sensing technique is used, in which a light source having an optical cavity is reflectively coupled to the sample surface. Changes in the surface properties of the sample at the sensed location alter the optical feedback in the light source. This leads to detectable changes in the output characteristics of the light source.
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