ATG test station
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United States of America Patent
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-
Feb 14, 1995
Grant Date -
N/A
app pub date -
Nov 17, 1993
filing date -
Nov 17, 1993
priority date (Note) -
Expired
status (Latency Note)
Importance
Abstract
A low cost, office environment platform for performing off-station verification and integration of Automatic Test Program Generation test program sets for digital circuit boards includes a general purpose computer which oversees integration of the test program sets developed on the simulator with the digital circuit boards using a basic test control unit such as the HP16500 Logic Analysis System. A method of utilizing this apparatus involves generating and simulating the test program sets and applying the test program sets to the digital circuit boards during development with feedback to the host computer on which the test program sets are generated.
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