Method of treating semiconductor materials

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United States of America Patent

PATENT NO 5395794
SERIAL NO

08052076

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Abstract

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A method for treatment of semiconductor material wherein the material is exposed to electromagnetic radiation having a frequency in the range of the resonance frequency in order to alter the relative positions of interstitial impurity ions and lattice nodes of the interstitial ions. The intensity of the electric field is selected to be proportional to the value of activation barrier potential of the impurity ions. The method is useful in providing accelerated diffusion of a doping impurity, activation of the ions of an implanted impurity, or in creation of metallic ohmic contacts at the surface of the semiconductor material without heating of the semiconductor material.

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Patent Owner(s)

Patent OwnerAddress
GYROTRON TECHNOLOGY INC A DELAWARE CORPORATION2014 FORD ROAD 11 BRISTOL PA 19007

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Bunenko, Andrei I Apt. 58, Lomonosova St. 8, Kiev 252040, UA 1 4
Guroshev, Vyacheslav I Apt. 219, Gen. Naumov St. 19, Kiev 252164, UA 1 4
Shevelev, Mikhail V Apt. 10, Reitarskaya St. 25, Kiev 252034, UA 1 4
Sklyarevich, Vladislav E Apt 36, Vladimirskaya St. 71, Kiev 252033, UA 4 52

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