Apparatus and method for specifying the flow of test execution and the binning for a testing system
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United States of America Patent
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Mar 21, 1995
Grant Date -
N/A
app pub date -
Apr 6, 1992
filing date -
Apr 6, 1992
priority date (Note) -
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Abstract
The present invention is a method for specifying test flow and binning of an integrated circuit part in an integrated circuit tester. The method comprises the steps of receiving descriptions of the tests, receiving test flow statements indicating when the tests are to be executed, receiving binning statements, executing the tests as indicated by the test flow statements, and binning the IC device as indicated by the results of the tests.
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