Interferametric measuring system with air turbulence compensation
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United States of America Patent
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Apr 4, 1995
Grant Date -
N/A
app pub date -
Jan 14, 1994
filing date -
Jan 14, 1994
priority date (Note) -
Expired
status (Latency Note)
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Abstract
An improved interferometric measuring system wherein the system projects a first beam of light at a first measurement wavelength along a reference path to a reference reflector and a second beam of light at a second measurement wavelength along a measurement path to a measurement reflector, and determines a change in position of the measurement reflector from an interference pattern produced between a first light beam reflected from the reference reflector and a second light beam reflected from the measurement reflector, and wherein the system can measure atmospheric disturbances along the measurement path, concurrently with measuring a change in the position of the measurement reflector.
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