US Patent No: 5,410,163

Number of patents in Portfolio can not be more than 2000

Semi-conductor integrated circuit device including connection and disconnection mechanisms to connect and disconnect monitor circuit and semiconductor integrated circuit from each other

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Importance

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Abstract

A monitor circuit provided in a chip in which a semiconductor integrated circuit is formed. Connection mechanisms and disconnection mechanisms are connected in series in wirings connected to the monitor circuit. Before using the semiconductor integrated circuit, in the state that the connection mechanisms are opened, the monitor circuit is tested without conducting the monitor circuit to the semiconductor integrated circuit. In the case of using the semiconductor integrated circuit, the connection mechanisms are written to close them, so that the monitor circuit is connected to the semiconductor circuit main body and is thus driven. Further, after using the semiconductor integrated circuit, the monitor circuit is separated from the semiconductor integrated circuit by writing the disconnection mechanisms, to be investigated for the characteristic.

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First Claim

Related Publications

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Patent Owner(s)

Patent OwnerAddressTotal Patents
FUJITSU SEMICONDUCTOR LIMITEDTOKYO4441

International Classification(s)

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  • [Patents Count]

Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Murakami, Shizuhiko Kawasaki, JP 1 13

Cited Art

Patent Info (Count) # Cites Year
 
MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD. (1)
5,105,235 Semiconductor integrated circuit having light emitting MOS devices 4 1990
 
NEC CORPORATION (1)
4,800,418 Integrated circuit with improved monitoring function by use of built-in elements 22 1985
 
SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC (1)
5,025,298 Semiconductor structure with closely coupled substrate temperature sense element 23 1989
 
TEXAS INSTRUMENTS INCORPORATED (1)
5,200,919 Electrically-erasable, electrically-programmable read-only memory cell with a selectable threshold voltage and methods for its use 18 1991
 
OTHER [CHECK PATENT PROFILE FOR ASSIGNMENT INFORMATION] (1)
4,961,053 Circuit arrangement for testing integrated circuit components 133 1988

Patent Citation Ranking

Forward Cites

Patent Info (Count) # Cites Year
 
FREESCALE SEMICONDUCTOR, INC. (2)
6,140,212 Semiconductor device and method therefor 0 1998
6,163,063 Semiconductor device 0 2000
 
INTEL CORPORATION (2)
5,686,759 Integrated circuit package with permanent identification of device characteristics and method for adding the same 15 1995
5,670,825 Integrated circuit package with internally readable permanent identification of device characteristics 2 1995
 
ADVANCED MICRO DEVICES, INC. (1)
6,262,435 Etch bias distribution across semiconductor wafer 16 1998
 
FAIRCHILD KOREA SEMICONDUCTOR LTD. (1)
6,433,386 Sense FET having a selectable sense current ratio and method of manufacturing the same 10 1998
 
INTERNATIONAL BUSINESS MACHINES CORPORATION (1)
6,252,292 Vertical electrical cavity-fuse 6 1999
 
MITSUMI ELECTRIC CO., LTD. (1)
5,880,016 Method for adjusting the circuit characteristic of a circuit body by cutting wires external to the circuit body 0 1997
 
NORTHROP GRUMMAN SYSTEMS CORPORATION (1)
7,130,032 Alternate test method for RF cable testing to avoid long test cables 0 2005
 
RENESAS ELECTRONICS CORPORATION (1)
6,629,295 Design automation method and device 3 1999
 
SGS-THOMSON MICROELECTRONICS S.A. (1)
5,969,403 Physical fuse for semiconductor integrated circuit 8 1996
 
TELEDYNE SCIENTIFIC & IMAGING, LLC (1)
6,958,491 Bipolar transistor test structure with lateral test probe pads 0 2003
 
XILINX, INC. (1)
5,486,776 Antifuse-based programmable logic circuit 34 1994