Method and apparatus for analyzing a gas sample

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United States of America Patent

PATENT NO 5412207
SERIAL NO

08133592

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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A method and gas analysis system for a mass spectrometer including an ion pump for creating an internal vacuum within said mass spectrometer, an ionization chamber, an inlet passage through which a gas sample is introduced into the ionization chamber, valve means associated with the inlet passage for controlling the volume of gas sample introduced into the ionization chamber, a filament for introducing electrons into the ionization chamber whereby the electrons bombard the gas sample thus forming ions, an extractor plate positioned adjacent the ionization chamber and biased such that a proportion of ions and electrons are allowed to pass through the extractor plate, a quadrupole filter into which the ions and electrons are directed by the extractor plate, the quadrupole filter operative to permit a stream of ions with a pre-selected mass-to-charge ratio to pass through the filter and ions other than those having the pre-selected mass-to-charge ratio being separated from the stream of ions, means for directing electrons toward ions other than those having the pre-selected mass-to-charge ratio in the area of said quadrupole filter so that the electrons combine with the ions, a sensor for detecting the stream of ions passing through the quadrupole filter, and analyzing means connected with the sensor for analyzing the components of the gas sample.

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Patent Owner(s)

Patent OwnerAddress
MARQUETTE ELECTRONICS INC8200 WEST TOWER AVENUE MILWAUKEE WI 53223

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Baer, Norman W Boulder, CO 2 29
Ellis, Donald G Boulder, CO 18 863
Micco, Alexander J Lakewood, CO 3 77

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