Method to reduce test vectors/test time in devices using equivalent blocks
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United States of America Patent
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May 2, 1995
Issued Date -
N/A
app pub date -
Oct 9, 1992
filing date -
Jan 22, 1991
priority date (Note) -
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Abstract
A method and apparatus for testing the functionality of a circuit are disclosed which reduce the number of vectors required to simulate and test cells having, for example, similar functions. By using a number of vectors which is independent of the number of cells or blocks in the circuit, the need for multiple test modes is reduced such that the time and cost associated with a functionality test can be reduced.
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