Parametric test circuit with plural range resistors
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United States of America Patent
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-
May 9, 1995
Grant Date -
N/A
app pub date -
Jan 26, 1993
filing date -
Jan 26, 1993
priority date (Note) -
Expired
status (Latency Note)
Importance
Abstract
A parametric test circuit adapted for testing a device in two alternate modes of operation. In one mode, the circuit forces a voltage on the device under test and measures the current drawn. In the alternate mode, the circuit forces voltage on the device under test and measures the voltage. The same circuit components including a difference amplifier are used in both modes of operation, and they are merely reconfigured by a plurality of switches. Further, a plurality of range resistor sections are used, and the nonselected sections are prevented from interfering with the selected section by zero-biasing anti-parallel diode pairs in series with the nonselected range resistors.
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