Apparatus and method for measuring programmed antifuse resistance
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United States of America Patent
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May 9, 1995
Grant Date -
N/A
app pub date -
Sep 8, 1993
filing date -
Sep 8, 1993
priority date (Note) -
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Abstract
Apparatus for measuring the resistance of a programmed antifuse in an integrated circuit is integrated on the same integrated circuit as the antifuse and is controlled by a programming circuit disposed on an integrated circuit and comprises a first voltage sensing transistor having a first drain/source electrically connected to a first I/O pad, a gate electrically connected to the programming circuit, and a second drain/source electrically connected to a first electrode of the antifuse, and a second voltage sensing transistor having a first drain/source electrically connected to a second I/O pad, a gate electrically connected to the programming circuit, and a second drain/source electrically connected to a second electrode of the antifuse.
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