Method for measuring the contour of a machined part

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United States of America Patent

PATENT NO 5419222
SERIAL NO

08145537

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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A method for measuring the contour of a machined part with a contour gage apparatus, having a probe assembly including a probe tip for providing a measure of linear displacement of the tip on the surface of the part. The contour gage apparatus may be moved into and out of position for measuring the part while the part is still carried on the machining apparatus. Relative positions between the part and the probe tip may be changed, and a scanning operation is performed on the machined part by sweeping the part with the probe tip, whereby data points representing linear positions of the probe tip at prescribed rotation intervals in the position changes between the part and the probe tip are recorded. The method further allows real-time adjustment of the apparatus machining the part, including real-time adjustment of the machining apparatus in response to wear of the tool that occurs during machining.

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Patent Owner(s)

  • THE UNITED STATES OF AMERICA AS REPRESENTED BY THE UNITED STATES DEPARTMENT OF ENERGY

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Bieg, Lothar F Louisville, CO 14 574

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