US Patent No: 5,419,637

Number of patents in Portfolio can not be more than 2000

Method and apparatus for measuring temperature using an inherently calibrated p-n junction-type temperature sensor

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Abstract

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An integrated circuit, diode-based temperature sensor circuit (10) is amenable to fabrication upon a readout circuit (12) that is coupled during use to a FPA or radiation detectors. The sensor circuit is inherently self-calibrated, and provides for a cancellation of circuit offsets and other error sources. The circuit has an output that is time-multiplexed onto a data path that normally conveys a video data stream away from the readout circuit. The circuit operates to selectively forward bias a diode (D1) with two different currents. A difference between the currents is shown to indicate the temperature of the diode's p-n junction.

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Patent Owner(s)

Patent OwnerAddressTotal Patents
OL SECURITY LIMITED LIABILITY COMPANYDOVER, DE510

International Classification(s)

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Frye, William H Oceanside, CA 11 137
Woodbury, Eric J Santa Barbara, CA 1 16

Cited Art Landscape

Patent Info (Count) # Cites Year
 
ANALOG DEVICES, INC. (1)
* 5,195,827 Multiple sequential excitation temperature sensing method and apparatus 72 1992
* Cited By Examiner

Patent Citation Ranking

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Patent Info (Count) # Cites Year
 
STANDARD MICROSYSTEMS CORPORATION (8)
6,847,319 Temperature-to-digital converter 9 2003
7,030,793 Accurate testing of temperature measurement unit 5 2004
7,281,846 Integrated resistance cancellation in temperature measurement systems 50 2004
7,140,767 Programmable ideality factor compensation in temperature sensors 5 2004
7,429,129 Proportional settling time adjustment for diode voltage and temperature measurements dependent on forced level current 16 2005
7,622,903 EMI rejection for temperature sensing diodes 1 2005
7,193,543 Conversion clock randomization for EMI immunity in temperature sensors 14 2005
8,696,199 Proportional settling time adjustment for diode voltage and temperature measurements dependent on forced level current 1 2008
 
SCHNEIDER AUTOMATION INC. (2)
* 6,679,628 Solid state temperature measuring device and method 18 2001
* 7,048,438 Solid state temperature measuring device and method 3 2003
 
AVAGO TECHNOLOGIES GENERAL IP (SINGAPORE) PTE. LTD. (1)
* 7,648,270 Temperature measurement of an integrated circuit 1 2004
 
GLOBALFOUNDRIES INC. (1)
* 5,961,215 Temperature sensor integral with microprocessor and methods of using same 94 1997
 
ILLINOIS TOOL WORKS INC. (1)
* 5,719,378 Self-calibrating temperature controller 72 1996
 
MAXIM INTEGRATED PRODUCTS, INC. (1)
* 5,990,725 Temperature measurement with interleaved bi-level current on a diode and bi-level current source therefor 16 1997
 
MOTOROLA SOLUTIONS, INC. (1)
* 5,781,075 Temperature sensing apparatus 24 1996
 
STMICROELECTRONICS ASIA PACIFIC PTE LTD. (1)
* 6,811,309 Thermal sensor circuit 8 2002
* Cited By Examiner