Method and apparatus for measuring temperature using an inherently calibrated p-n junction-type temperature sensor

Number of patents in Portfolio can not be more than 2000

United States of America Patent

PATENT NO 5419637
SERIAL NO

08147185

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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An integrated circuit, diode-based temperature sensor circuit (10) is amenable to fabrication upon a readout circuit (12) that is coupled during use to a FPA or radiation detectors. The sensor circuit is inherently self-calibrated, and provides for a cancellation of circuit offsets and other error sources. The circuit has an output that is time-multiplexed onto a data path that normally conveys a video data stream away from the readout circuit. The circuit operates to selectively forward bias a diode (D1) with two different currents. A difference between the currents is shown to indicate the temperature of the diode's p-n junction.

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Patent Owner(s)

Patent OwnerAddressTotal Patents
OL SECURITY LIMITED LIABILITY COMPANYDOVER, DE1162

International Classification(s)

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Frye, William H Goleta, CA 11 153
Woodbury, Eric J Santa Barbara, CA 1 16

Cited Art Landscape

Patent Info (Count) # Cites Year
 
ANALOG DEVICES, INC. (1)
* 5195827 Multiple sequential excitation temperature sensing method and apparatus 75 1992
* Cited By Examiner

Patent Citation Ranking

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Patent Info (Count) # Cites Year
 
MAXIM INTEGRATED PRODUCTS, INC. (1)
* 5990725 Temperature measurement with interleaved bi-level current on a diode and bi-level current source therefor 16 1997
 
INTERNATIONAL BUSINESS MACHINES CORPORATION (1)
* 2004/0066,837 Method and apparatus for providing accurate junction temperature in an integrated circuit 2 2002
 
ILLINOIS TOOL WORKS INC. (1)
* 5719378 Self-calibrating temperature controller 78 1996
 
3M INNOVATIVE PROPERTIES COMPANY (1)
* 2004/0058,129 Patterned polymer articles 3 2003
 
STANDARD MICROSYSTEMS CORPORATION (13)
* 2005/0017,889 TEMPERATURE-TO-DIGITAL CONVERTER 7 2003
6847319 Temperature-to-digital converter 13 2003
7030793 Accurate testing of temperature measurement unit 6 2004
7281846 Integrated resistance cancellation in temperature measurement systems 55 2004
* 2006/0039,445 Integrated resistance cancellation in temperature measurement systems 3 2004
7140767 Programmable ideality factor compensation in temperature sensors 9 2004
* 2006/0093,016 Programmable ideality factor compensation in temperature sensors 5 2004
7429129 Proportional settling time adjustment for diode voltage and temperature measurements dependent on forced level current 29 2005
* 2006/0193,370 Integrated resistance cancellation in temperature measurement systems 5 2005
7622903 EMI rejection for temperature sensing diodes 1 2005
7193543 Conversion clock randomization for EMI immunity in temperature sensors 15 2005
* 2007/0055,473 EMI rejection for temperature sensing diodes 5 2005
8696199 Proportional settling time adjustment for diode voltage and temperature measurements dependent on forced level current 2 2008
 
STMICROELECTRONICS ASIA PACIFIC PTE., LTD. (1)
* 6811309 Thermal sensor circuit 8 2002
 
GLOBALFOUNDRIES INC. (1)
* 5961215 Temperature sensor integral with microprocessor and methods of using same 100 1997
 
SCHNEIDER AUTOMATION INC. (2)
* 6679628 Solid state temperature measuring device and method 18 2001
* 7048438 Solid state temperature measuring device and method 4 2003
 
AVAGO TECHNOLOGIES GENERAL IP (SINGAPORE) PTE. LTD. (2)
* 7648270 Temperature measurement of an integrated circuit 3 2004
* 2005/0220,171 Temperature measurement of an integrated circuit 11 2004
 
MOTOROLA SOLUTIONS, INC. (1)
* 5781075 Temperature sensing apparatus 24 1996
* Cited By Examiner