Test strip analysis system
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United States of America Patent
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Jun 13, 1995
Grant Date -
N/A
app pub date -
Mar 29, 1994
filing date -
Mar 31, 1993
priority date (Note) -
In Force
status (Latency Note)
Importance
Abstract
Test strip analysis system includes an analysis apparatus with a test strip holding device (3) and matching test strips. The test strip holding device (3) serves to position the test strip (4) in a defined position relative to a measuring unit (11). It includes a test strip seating device (20) and a guide for the test strip. Exact positioning with simple handling and without sophisticated mechanical elements is achieved by the fact that at least one part of the test strip seating device (20), in the area in which, in the measuring position, the front section (12) of the test strip is located, is formed as a support (24) which is offset in height relative to the middle plane (22) of the test field area (13). The test strip holding device (3) includes a pressure element (33) which, in the measuring position presses between the support (24) and the test field area (13) of the test strip (4) against the side (34) opposite the seating device ( 20) of the latter. The test strip (4) is consequently subjected to bending stress, whereby the particular distance of the at least one test field (6) from the measuring unit (11) is ensured.
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