Semiconductor integrated circuit incorporating photo detectors
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United States of America Patent
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-
Jun 13, 1995
Grant Date -
N/A
app pub date -
Oct 12, 1993
filing date -
Oct 26, 1992
priority date (Note) -
Expired
status (Latency Note)
Importance
Abstract
In response to a test signal received at a test terminal, one terminal of a first computation circuit and three terminals of a second computation circuit are each provided with a reference voltage, or a ground potential, which is available at reference voltage supply terminals associated with photo detectors. Another terminal of the first computation circuit and the second computation circuit are each provided with a detected voltage. If the functions of the computation circuits are not defective, function signals will be obtained each having a value which corresponds to an imbalance between the detected voltage and the reference voltage. Thus, only one test terminal is required, which reduces the size of the semiconductor integrated circuit.
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