Driver circuits for IC tester
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United States of America Patent
Stats
-
Jul 4, 1995
Grant Date -
N/A
app pub date -
Aug 3, 1993
filing date -
Aug 3, 1993
priority date (Note) -
In Force
status (Latency Note)
Importance
Abstract
Driver circuits are provided which also serve as termination and clamp in an IC tester. When it is to drive a port of a device under test (DUT) between two predetermined voltage levels, the driver's I/O terminal is switched between two predetermined voltage levels with an output impedance that matches the transmission line between the driver circuit and the DUT. When the DUT's port is supplying an output signal, the driver circuit can be programmed to provide one of two types of termination. If the DUT's port is specified as capable of driving the load, the transmission line between the driver circuit and the DUT is terminated by switching the driver circuit's I/O terminal to a predetermined voltage level with an impedance of Z.sub.0. If the DUT's port is not specified as being capable of driving such a termination load, the driver circuit functions like a Z-clamp circuit.
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