Variable magnification color scanning light microscope
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United States of America Patent
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-
Jul 4, 1995
Grant Date -
N/A
app pub date -
Dec 14, 1992
filing date -
Dec 14, 1992
priority date (Note) -
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status (Latency Note)
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Abstract
An improved imaging system operates at the diffraction limit of the optics to which it is connected and outputs a signal representative of the sample lying in the sample plane. The imaging system comprises a cathode ray tube, an optical lens system and a means for sensing. The cathode ray tube comprises an electron gun for generating an electron beam in a raster pattern. The raster pattern comprises a predetermined number of horizontal lines that are spaced vertically from each other a predetermined and equal distance. The electron beam is adapted to produce an illuminated spot that scans correspondingly in the raster pattern and wherein the spot is positioned in an object plane. The optical lens system for focusing in a diffraction limited manner, the object plane on to the sample plane, such that the image of the spot is the smallest diffraction limited size as determined by the optical lens system. The imaging system also includes zoom and contrast enhancement/suppression capabilities.
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