Combination of X-ray diffractometer and solid state detector and method of use thereof

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United States of America Patent

PATENT NO 5432832
SERIAL NO

08100142

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Abstract

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A combination of X-ray diffractometer and solid state detector is much faster than previous diffractometers and detectors in that X-ray photons that impinge on the detector do not have to be counted in the single photon counting mode.

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Patent Owner(s)

Patent OwnerAddress
PANALYTICAL B V7600 AA ALMELO

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Fierling, James H Kitchener, CA 2 11
Moore, Christopher J L St. Jacobs, CA 2 11

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