Non-contacting capacitance probe for dielectric cure monitoring
Number of patents in Portfolio can not be more than 2000
United States of America Patent
Stats
-
Jul 25, 1995
Grant Date -
N/A
app pub date -
Sep 14, 1992
filing date -
Sep 14, 1992
priority date (Note) -
Expired
status (Latency Note)
Importance
Abstract
Conductive measuring electrodes, of a capacitive probe having a grounded rd electrode positioned therebetween shield a probe circuit, provides mutual capacitance measurements which way as a function of changes in impedance of dielectric material being monitored as it undergoes a curing process. The probe is positioned in non-embedded relation to the dielectric material to form a sensitivity region therein through which an electric field extends between the conductive measuring electrodes of the probe to establish said variable mutual capacitance measurements without extraneous influences.
First Claim
Family
International Classification(s)
Cited Art Landscape
Patent Citation Ranking
Advertisement
Advertisement
Advertisement
Recipient Email Address
Recipient Email Address
Comment
Recipient Email Address
Add to Portfolio(s)
To add this patent to one, or more, of your portfolios, simply click the add button.
This Patent is in these Portfolios:
Add to additional portfolios:
Last Refreshed On:
Changes done successfully