Plasma CVD process for forming amorphous silicon thin film

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United States of America Patent

PATENT NO 5437895
SERIAL NO

08276906

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A process for forming a thin film of amorphous silicon of a uniform thickness on a relatively large glass plate. The process comprising forming a thin film of amorphous silicon on an insulating substrate by a plasma enhanced chemical vapor deposition process while intermittently generating a high frequency discharge. The duration of each discharge is set shorter than the time period necessary for the DC bias voltage, which is generated on the high frequency-applying electrode side, to attain a saturated value.

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Patent OwnerAddress
ANELVA CORPORATION8-1 YOTSUYA 5-CHOME FUCHU-SHI TOKYO

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Kodama, Akira Tokyo, JP 33 257
Ueda, Massashi Tokyo, JP 1 21
Watabe, Yoshimi Tokyo, JP 11 244

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