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Abstract

The device of the invention calibrates an apparatus for measuring the thickness profile of flat products, for example metal sheets, of the type which includes a source (10) of radiation, for example an X-ray source, and a row (20) of elementary detectors (21) which are aligned along the direction (P) of the profile to be measured and are placed on either side of a zone (2) for passage of said product. The device includes a set (32) of shims (33) having different radiation absorption characteristics, a carriage (30) for supporting the shims which is movable along the direction (P). For the calibration, the set of shims is moved in the passage zone so that each shim may intercept the radiation emitted by the source in the direction of each detector. During the movement of the carriage, a plurality of readings of the signals emitted by the detectors are taken so as to obtain, for each detector, a set of values of the signals representing the intensity of the radiation absorbed by each shim, and the calibration curve of each sensor is established on the basis of these values.

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First Claim