Method and apparatus for analyzing stained particles
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United States of America Patent
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Sep 12, 1995
Grant Date -
N/A
app pub date -
Feb 16, 1994
filing date -
Feb 16, 1993
priority date (Note) -
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Abstract
In a stained particle analyzing method and apparatus for staining a test sample containing suspended particles, shooting an image of the stained sample, and classifying the particles and computing the density from the shot image of the sample, the sample, which may not be analyzed precisely, is detected before the start of an image analyzing process. Only the sample, which will be analyzed precisely, is stained and subjected to the image analysis. Color information of the sample before the staining is detected and stored. Color information of an image of the sample shot after the staining is compensated based on the color information of the sample detected before the staining. The sort and density of the particles are classified and computed on the basis of the image after the color compensation.
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