Method and apparatus for determining an objects position, topography and for imaging
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United States of America Patent
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Sep 12, 1995
Grant Date -
N/A
app pub date -
Dec 22, 1993
filing date -
Dec 22, 1993
priority date (Note) -
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Abstract
Light is supplied via a optical fiber to a probe head. The light exiting the optical fiber is focused to a point by a lens. Reflected light from an object at or near the focal point is reflected back through the lens and then focused to the source optical fiber or a second optical fiber located next the source optical fiber. The return signal is then detected in a detector module. By noting the characteristics of the response curve as the object is moved back and forth relative to the probe head, the position of the object can be determined. By performing this procedure over several points, a detailed topography map can be created. Additionally, the probe head can be scanned at a constant distance from the surface to produce an image of the surface as the response signal varies according to the surface's reflectivity. The microprobe can be used, for example, to find the position of probe tips on a wafer prober, to determine the topography of the surface of the wafer, and to find the position of the wafer edge.
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Patent Owner(s)
| Patent Owner | Address | |
|---|---|---|
| MARTEK INC | 112 SOUTH ROCKFORD DRIVE SUITE 103 TEMPE AS 85281 |
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Inventor(s)
| Inventor Name | Address | # of filed Patents | Total Citations |
|---|---|---|---|
| Penkethman, John A | Gilroy, CA | 5 | 316 |
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| Fee | Large entity fee | small entity fee | micro entity fee |
|---|---|---|---|
| Surcharge after expiration - Late payment is unavoidable | $700.00 | $350.00 | $175.00 |
| Surcharge after expiration - Late payment is unintentional | $1,640.00 | $820.00 | $410.00 |
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