Circuit-test fixture that includes shorted-together probes
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United States of America Patent
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-
Oct 10, 1995
Grant Date -
N/A
app pub date -
May 11, 1994
filing date -
May 11, 1994
priority date (Note) -
In Force
status (Latency Note)
Importance
Abstract
In a fixture (24) are mounted a plurality of probes (28) so disposed as to enable them simultaneously to contact test points on a circuit board (26) to be subjected to an in-circuit test. Wiring (30) connects the probes (28) to respective fixture pins (22) that mate with the system pins (20) by which a general-purpose tester (12) provides connections to various test instruments (14). The wiring (20) is so provided that certain of the probes (28) are wired together and thus require fewer system pins (20) than there are probes (28).
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Cited Art Landscape
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