Automated process planning for quality control inspection
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United States of America Patent
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Nov 7, 1995
Grant Date -
N/A
app pub date -
Dec 30, 1993
filing date -
Dec 30, 1993
priority date (Note) -
In Force
status (Latency Note)
Importance
Abstract
A computer is used for generating a part inspection plan for a coordinate measuring machine (CMM), in a feature-based rapid design system (RDS), having a Feature-Based Design Environment (FBDE), an Episodal Associative Memory (EAM), Fabrication Planning (FAB), and an Inspection Plan (INSP), with features which include form features (D1) which define the form or shape of the part, manufacturing features (D2), inspection features (D3), and geometric and design (GD&T) features (D4). The Inspection Plan (INSP) includes interaction means wherein the inspector interacts with the system to guide it to a desired result, and the inspector can define setups, measurement points, sequence for the points, and the via points. For the inspector's sequence input, a learning process is included, so that the inspector's desired sequence is sent to discovery means for organizing patterns and defining rules, which by recalling relevant past experiences, and learning from the inspector's input, creates a 'self-improving' expert system.
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