Programmable, scanned-probe microscope system and method
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United States of America Patent
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Nov 14, 1995
Grant Date -
N/A
app pub date -
Jan 20, 1995
filing date -
Jan 20, 1995
priority date (Note) -
In Force
status (Latency Note)
Importance
Abstract
Scanned-probe microscope systems (20, 140) are disclosed with analog control loops (24, 144) that can be electronically programmed to select from a plurality of transfer functions. The amplitude of the control loop reference signal (64) can also be electronically programmed. A controller (26) enables an operator to quickly program these operational characteristics. The controller preferably includes a visual display (33) and a recording device (32) to facilitate the programming and to display and store the scanning data obtained with the selected characteristics.
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