US Patent No: 5,467,024

Number of patents in Portfolio can not be more than 2000

Integrated circuit test with programmable source for both AC and DC modes of operation

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Abstract

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An integrated device test system (10, 40) having AC and DC measurement modes of operation comprises a drive circuit (11, 41), a programmable measurement unit (12) and a switch (18). The drive circuit (11, 41) may be a current mode drive circuit (11) or a voltage mode drive circuit (41). The drive circuit (11, 41) is coupled to the programmable measurement unit (12) and a device under test (64). In a DC mode of operation, the switch (18) is configured to couple a sense terminal (39) with one end of an isolation resistor (66). A second end of the isolation resistor (66) is connected to a pin (63) of the device under test (64). In an AC mode of operation, the switch (18) is configured to couple the sense terminal (39) with the drive circuit (11, 41) and the force terminal (35) of the programmable measurement unit (12).

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First Claim

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Patent Owner(s)

Patent OwnerAddressTotal Patents
FREESCALE SEMICONDUCTOR, INC.AUSTIN, TX7458

International Classification(s)

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Swapp, Mavin C Gilbert, AZ 24 427

Cited Art Landscape

Patent Info (Count) # Cites Year
 
SCHLUMBERGER SYSTEMS AND SERVICES, INC. (2)
4,637,020 Method and apparatus for monitoring automated testing of electronic circuits 91 1984
4,646,299 Method and apparatus for applying and monitoring programmed test signals during automated testing of electronic circuits 113 1984
 
FAIRCHILD SEMICONDUCTOR CORPORATION (1)
5,101,153 Pin electronics test circuit for IC device testing 71 1991
 
Kabushiki Kaisha Sanwa Keiki Seisakusho (1)
5,319,305 Automatic range selection-type analog tester 10 1993

Patent Citation Ranking

Forward Cite Landscape

Patent Info (Count) # Cites Year
 
CASCADE MICROTECH, INC. (78)
7,233,160 Wafer probe 20 2001
7,355,420 Membrane probing system 5 2002
7,761,986 Membrane probing method using improved contact 2 2003
7,368,925 Probe station with two platens 4 2004
7,492,172 Chuck for holding a device under test 4 2004
7,161,363 Probe for testing a device under test 33 2004
7,427,868 Active wafer probe 10 2004
7,589,518 Wafer probe station having a skirting component 5 2005
7,554,322 Probe station 5 2005
7,330,041 Localizing a temperature of a device for testing 7 2005
7,368,927 Probe head having a membrane suspended probe 23 2005
7,352,168 Chuck for holding a device under test 9 2005
7,420,381 Double sided probing structures 1 2005
7,348,787 Wafer probe station having environment control enclosure 4 2005
7,656,172 System for testing semiconductors 3 2006
7,535,247 Interface for testing semiconductors 3 2006
7,271,603 Shielded probe for testing a device under test 32 2006
7,449,899 Probe for high frequency signals 2 2006
7,619,419 Wideband active-passive differential signal probe 0 2006
7,403,025 Membrane probing system 3 2006
7,533,462 Method of constructing a membrane probe 0 2006
7,504,823 Thermal optical chuck 3 2006
7,304,488 Shielded probe for high-frequency testing of a device under test 6 2006
7,321,233 System for evaluating probing networks 7 2007
7,362,115 Chuck with integrated wafer support 14 2007
7,764,072 Differential signal probing system 2 2007
7,723,999 Calibration structures for differential signal probing 1 2007
7,403,028 Test structure and probe for differential signals 20 2007
7,285,969 Probe for combined signals 1 2007
7,443,186 On-wafer test structures for differential signals 3 2007
7,639,003 Guarded tub enclosure 2 2007
7,504,842 Probe holder for testing of a test device 1 2007
7,468,609 Switched suspended conductor and connection 4 2007
7,688,097 Wafer probe 1 2007
7,609,077 Differential signal probe with integral balun 0 2007
8,069,491 Probe testing structure 0 2007
7,498,828 Probe station with low inductance path 5 2007
7,436,170 Probe station having multiple enclosures 3 2007
7,492,147 Wafer probe station having a skirting component 3 2007
7,681,312 Membrane probing system 1 2007
7,541,821 Membrane probing system with local contact scrub 0 2007
7,453,276 Probe for combined signals 3 2007
7,518,387 Shielded probe for testing a device under test 1 2007
7,550,984 Probe station with low noise characteristics 3 2007
7,616,017 Probe station thermal chuck with shielding for capacitive current 1 2007
7,761,983 Method of assembling a wafer probe 1 2007
7,688,062 Probe station 0 2007
7,495,461 Wafer probe 0 2007
7,456,646 Wafer probe 1 2007
7,501,842 Shielded probe for testing a device under test 1 2007
7,498,829 Shielded probe for testing a device under test 1 2007
7,417,446 Probe for combined signals 3 2007
7,969,173 Chuck for holding a device under test 1 2007
7,518,358 Chuck for holding a device under test 12 2007
7,514,915 Chuck for holding a device under test 10 2007
7,501,810 Chuck for holding a device under test 10 2007
7,423,419 Chuck for holding a device under test 9 2007
7,626,379 Probe station having multiple enclosures 3 2007
7,489,149 Shielded probe for testing a device under test 1 2007
7,482,823 Shielded probe for testing a device under test 2 2007
7,436,194 Shielded probe with low contact resistance for testing a device under test 0 2007
7,595,632 Wafer probe station having environment control enclosure 5 2008
7,492,175 Membrane probing system 3 2008
7,688,091 Chuck with integrated wafer support 1 2008
7,514,944 Probe head having a membrane suspended probe 2 2008
7,750,652 Test structure and probe for differential signals 3 2008
8,013,623 Double sided probing structures 0 2008
7,876,114 Differential waveguide probe 0 2008
7,759,953 Active wafer probe 0 2008
7,888,957 Probing apparatus with impedance optimized interface 3 2008
7,898,281 Interface for testing semiconductors 0 2008
7,898,273 Probe for testing a device under test 0 2009
7,876,115 Chuck for holding a device under test 1 2009
7,893,704 Membrane probing structure with laterally scrubbing contacts 3 2009
8,319,503 Test apparatus for measuring a characteristic of a device under test 1 2009
8,410,806 Replaceable coupon for a probing apparatus 0 2009
7,940,069 System for testing semiconductors 1 2009
8,451,017 Membrane probing method using improved contact 0 2010
 
TERADYNE, INC. (2)
6,836,136 Pin driver for AC and DC semiconductor device testing 13 2002
7,019,547 Pin driver for AC and DC semiconductor device testing 5 2004
 
AGILENT TECHNOLOGIES, INC. (1)
5,760,596 Testing series passive components without contacting the driven node 5 1997
 
LSI LOGIC CORPORATION (1)
7,183,791 Reliability circuit for applying an AC stress signal or DC measurement to a transistor device 4 2004
 
MEGATEST CORPORATION (1)
5,917,331 Integrated circuit test method and structure 31 1995
 
QIMONDA AG (1)
6,774,649 Test system for conducting a function test of a semiconductor element on a wafer, and operating method 4 2002
 
SAMSUNG ELECTRONICS CO., LTD. (1)
6,492,832 Methods for testing a group of semiconductor devices simultaneously, and devices amenable to such methods of testing 3 2002