An integrated device test system (10, 40) having AC and DC measurement modes of operation comprises a drive circuit (11, 41), a programmable measurement unit (12) and a switch (18). The drive circuit (11, 41) may be a current mode drive circuit (11) or a voltage mode drive circuit (41). The drive circuit (11, 41) is coupled to the programmable measurement unit (12) and a device under test (64). In a DC mode of operation, the switch (18) is configured to couple a sense terminal (39) with one end of an isolation resistor (66). A second end of the isolation resistor (66) is connected to a pin (63) of the device under test (64). In an AC mode of operation, the switch (18) is configured to couple the sense terminal (39) with the drive circuit (11, 41) and the force terminal (35) of the programmable measurement unit (12).
Please note there is up to 60 days of latency in this Status indicator for certain status conditions. You can obtain up-to-date Status indicator readings by ordering PAIR for the file.
An application with the status "Published" (which means it is pending) may be recently abandoned, but not yet updated to reflect its abandoned status. However, an application filed less than one year ago is unlikely to be abandoned.
A patent with the status "Granted" may be recently expired, but not yet updated to reflect its expired status. However, it is highly unlikely a patent less than 3.5 years old would be expired.
An application with the status "Abandoned" is almost always current, but there is a small chance it was recently revived and the status not yet updated.
This priority date is an estimated earliest
priority date and is purely an estimation. This date should not be
taken as legal conclusion. No representations are made as to the
accuracy of the date listed. Please consult a legal professional
before relying on this date.