Integrated circuit test with programmable source for both AC and DC modes of operation

Number of patents in Portfolio can not be more than 2000

United States of America Patent

PATENT NO 5467024
SERIAL NO

08143949

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ATTORNEY / AGENT: (SPONSORED)

Importance

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Abstract

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An integrated device test system (10, 40) having AC and DC measurement modes of operation comprises a drive circuit (11, 41), a programmable measurement unit (12) and a switch (18). The drive circuit (11, 41) may be a current mode drive circuit (11) or a voltage mode drive circuit (41). The drive circuit (11, 41) is coupled to the programmable measurement unit (12) and a device under test (64). In a DC mode of operation, the switch (18) is configured to couple a sense terminal (39) with one end of an isolation resistor (66). A second end of the isolation resistor (66) is connected to a pin (63) of the device under test (64). In an AC mode of operation, the switch (18) is configured to couple the sense terminal (39) with the drive circuit (11, 41) and the force terminal (35) of the programmable measurement unit (12).

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First Claim

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Patent Owner(s)

Patent OwnerAddressTotal Patents
APPLE INC.CUPERTINO, CA18047
FREESCALE SEMICONDUCTOR, INC.AUSTIN, TX1003

International Classification(s)

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Swapp, Mavin C Gilbert, AZ 24 438

Cited Art Landscape

Patent Info (Count) # Cites Year
 
Kabushiki Kaisha Sanwa Keiki Seisakusho (1)
* 5319305 Automatic range selection-type analog tester 11 1993
 
SCHLUMBERGER SYSTEMS AND SERVICES, INC. (2)
* 4637020 Method and apparatus for monitoring automated testing of electronic circuits 94 1984
* 4646299 Method and apparatus for applying and monitoring programmed test signals during automated testing of electronic circuits 117 1984
 
FAIRCHILD SEMICONDUCTOR CORPORATION (1)
* 5101153 Pin electronics test circuit for IC device testing 71 1991
* Cited By Examiner

Patent Citation Ranking

Forward Cite Landscape

Patent Info (Count) # Cites Year
 
POLARIS INNOVATIONS LIMITED (1)
* 6774649 Test system for conducting a function test of a semiconductor element on a wafer, and operating method 4 2002
 
TERADYNE, INC. (3)
* 6836136 Pin driver for AC and DC semiconductor device testing 16 2002
7019547 Pin driver for AC and DC semiconductor device testing 6 2004
* 2005/0088,197 Pin driver for AC and DC semiconductor device testing 0 2004
 
SAMSUNG ELECTRONICS CO., LTD. (1)
* 6492832 Methods for testing a group of semiconductor devices simultaneously, and devices amenable to such methods of testing 3 2002
 
AGILENT TECHNOLOGIES, INC. (1)
* 5760596 Testing series passive components without contacting the driven node 5 1997
 
Megatest Corporation (1)
* 5917331 Integrated circuit test method and structure 32 1995
 
ANALOG DEVICES, INC. (1)
* 2006/0273,811 Using an active load as a high current output stage of a precision pin measurement unit in automatic test equipment systems 3 2006
 
AVAGO TECHNOLOGIES GENERAL IP (SINGAPORE) PTE. LTD. (2)
* 7183791 Reliability circuit for applying an AC stress signal or DC measurement to a transistor device 5 2004
* 2006/0076,972 Reliability circuit for applying an AC stress signal or DC measurement to a transistor device 1 2004
 
CASCADE MICROTECH, INC. (79)
7233160 Wafer probe 23 2001
7355420 Membrane probing system 7 2002
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7492172 Chuck for holding a device under test 5 2004
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7427868 Active wafer probe 19 2004
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7368927 Probe head having a membrane suspended probe 32 2005
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7420381 Double sided probing structures 3 2005
7348787 Wafer probe station having environment control enclosure 6 2005
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7403025 Membrane probing system 5 2006
7533462 Method of constructing a membrane probe 2 2006
7504823 Thermal optical chuck 4 2006
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7362115 Chuck with integrated wafer support 14 2007
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7723999 Calibration structures for differential signal probing 3 2007
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7285969 Probe for combined signals 3 2007
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7688097 Wafer probe 4 2007
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8069491 Probe testing structure 2 2007
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7681312 Membrane probing system 4 2007
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7518387 Shielded probe for testing a device under test 4 2007
7550984 Probe station with low noise characteristics 4 2007
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7688062 Probe station 0 2007
7495461 Wafer probe 4 2007
7456646 Wafer probe 4 2007
7501842 Shielded probe for testing a device under test 5 2007
7498829 Shielded probe for testing a device under test 4 2007
7417446 Probe for combined signals 6 2007
7969173 Chuck for holding a device under test 2 2007
7518358 Chuck for holding a device under test 12 2007
7514915 Chuck for holding a device under test 10 2007
7501810 Chuck for holding a device under test 11 2007
7423419 Chuck for holding a device under test 9 2007
7626379 Probe station having multiple enclosures 18 2007
7489149 Shielded probe for testing a device under test 3 2007
7482823 Shielded probe for testing a device under test 5 2007
7436194 Shielded probe with low contact resistance for testing a device under test 4 2007
7595632 Wafer probe station having environment control enclosure 6 2008
7492175 Membrane probing system 5 2008
7688091 Chuck with integrated wafer support 1 2008
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8013623 Double sided probing structures 2 2008
7876114 Differential waveguide probe 12 2008
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7898281 Interface for testing semiconductors 4 2008
7898273 Probe for testing a device under test 3 2009
7876115 Chuck for holding a device under test 2 2009
7893704 Membrane probing structure with laterally scrubbing contacts 6 2009
8319503 Test apparatus for measuring a characteristic of a device under test 2 2009
8410806 Replaceable coupon for a probing apparatus 4 2009
7940069 System for testing semiconductors 3 2009
8451017 Membrane probing method using improved contact 3 2010
9429638 Method of replacing an existing contact of a wafer probing assembly 0 2013
* Cited By Examiner