Low dielectric constant insulation layer for integrated circuit structure and method of making same

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United States of America Patent

PATENT NO 5470801
SERIAL NO

08084821

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Abstract

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A low dielectric insulation layer for an integrated circuit structure material, and a method of making same, are disclosed. The low dielectric constant insulation layer comprises a porous insulation layer, preferably sandwiched between non-porous upper and lower insulation layers. The presence of some gases such as air or an inert gas, or a vacuum, in the porous insulation material reduces the overall dielectric constant of the insulation material, thereby effectively reducing the capacitance of the structure. The porous insulation layer is formed by a chemical vapor deposition of a mixture of the insulation material and a second extractable material; and then subsequently selectively removing the second extractable material, thereby leaving behind a porous matrix of the insulation material, comprising the low dielectric constant insulation layer.

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Patent Owner(s)

Patent OwnerAddress
LSI LOGIC CORPORATION1551 MCCARTHY BOULEVARD MILPITAS CA 95035

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Kapoor, Ashok K Palo Alto, CA 101 3596
Pasch, Nicholas F Pacifica, CA 159 4855

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