Apparatus for testing counter circuit
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United States of America Patent
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Dec 26, 1995
Grant Date -
N/A
app pub date -
Feb 2, 1993
filing date -
Feb 3, 1992
priority date (Note) -
In Force
status (Latency Note)
Importance
Abstract
In an apparatus for testing a counter circuit, a test pattern is used to drive the counter circuit to obtain an output pattern. The output pattern is compared with an expected pattern in synchronization with the test pattern, thereby determining whether or not the counter circuit is normal. A phase between the output pattern and the expected pattern is initially adjusted by the testing apparatus.
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