Positioning mechanism and method for providing coaxial alignment of a probe and a scanning means in scanning tunneling and scanning force microscopy
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United States of America Patent
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Jan 9, 1996
Grant Date -
N/A
app pub date -
Jan 21, 1994
filing date -
Jan 21, 1994
priority date (Note) -
Expired
status (Latency Note)
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Abstract
A scanning microscope wherein the probe operates at all times in alignment with the piezoelectric element providing the scanning motion. A sample is slidably connected to the piezoelectric element and the target area on the sample is positioned substantially coaxially with the probe and the scanning element prior to commencement of the scanning operation. A particular embodiment of a sample positioner is provided that eliminates any interference by the positioner with the sample during scanning.
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