Eddy current testing system with scanning probe head having parallel and normal sensing coils
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United States of America Patent
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Jan 9, 1996
Issued Date -
N/A
app pub date -
Feb 28, 1994
filing date -
Nov 7, 1988
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Expired
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Abstract
An eddy current testing system consists of a multi-sensor probe, a computer and a special expansion card and software for data collection and analysis. The probe incorporates an excitation coil, and sensor coils; at least one sensor coil is a lateral current-normal coil and at least one is a current perturbation coil.
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