Metrology instrument arm system
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United States of America Patent
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Feb 6, 1996
Issued Date -
N/A
app pub date -
Oct 11, 1994
filing date -
Sep 1, 1989
priority date (Note) -
Expired
status (Latency Note)
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Abstract
The present invention relates generally to a metrology framework for determining the position of a first object, such as an operator, relative to a second object when the first object is moved relative to the second object. The metrology framework comprises a plurality of extensible instrument arms that are operatively connected in proximity to the first object and the second object. A sensor is in communication with each extensible instrument arm to provide a signal indicative of the extension of the instrument arm. The combination of the signals can be used to determine the position of the first object relative to the second object in all six degrees of freedom.
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